- Published: Monday, 02 April 2012 17:23
The main objective of the NanoXCT project is the design, development and implementation of a compact X-ray computed tomography system for nondestructive chemical and structural characterization of nano-materials and components. The targeted system will avoid expensive X-ray optical elements and not rely on a synchrotron source, which would both extend the costs and would constrain the application areas of the aimed at NanoXCT device.
- Published: Monday, 02 April 2012 17:22
All the tremendous achievements in miniaturization from micro to nano-scale would not have been possible without the material analytics in behind. Material analytics for nano-scale characterization currently covers destructive methods, surface inspection methods, or 2D methods. However, yet it is not possible to get a comprehensive representation of a specimen including internal and external 3D-structure analysis as well as a chemical analysis without destroying the sample.