- Published: Monday, 02 April 2012 17:21
Currently industrial X-ray computed tomography (XCT) is just touching the nanometer scale and is still suffering several severe limitations. The main limitations of XCT currently avoiding the application on chemical and structural nano-scale characterization are found in the limited field of view, X-ray source, detector, XCT system itself and in the lack of a method for comprehensive chemical and structural analysis.
The NanoXCT project addresses these limitations using various novel approaches to facilitate nano-scale structural and chemical analysis using X-ray computed tomography in combination with X-ray fluorescence. NanoXCT comprises the concept of an ultra-bright X-ray source in combination with a high precision focusing and emission system. Furthermore, a highly sensitive, photon counting wide field of view small pitch X-ray detector concept will be included. The concept is perfected with a high precision manipulation system, which allows for alternative scanning geometries as helical CT, and a suitable software environment for data processing and analysis. The chemical analysis will be achieved by a combination of the multi energy XCT technique and X-ray fluorescence.